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在r面蓝宝石上生长的a面掺硅GaN的光学和电学性质研究 被引量:1

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摘要 在r面蓝宝石(Al2O3)衬底上生长了非极性掺硅的a面GaN薄膜,用光致发光(PL)谱,高分辨X射线衍射仪(HRXRD),原子力显微镜(AFM),和霍尔测量研究了材料的光学和电学性质.结果表明,Si的掺入会使材料的结晶质量和形貌出现微小的退化.黄带也随着SiH4流量的增加而提高.但是随着硅的掺入,材料迁移率极大提高,这种现象主要是由于镓空位(VGa)被填补引起的.
出处 《中国科学:技术科学》 EI CSCD 北大核心 2011年第2期234-238,共5页 Scientia Sinica(Technologica)
基金 国家科技重大专项(批准号:2008ZX01002-002) 国家自然科学基金重大项目(批准号:60890191) 国家自然科学基金重点项目(批准号:60736033) 中央高校基本科研业务费专项资金(批准号:JY10000904009)资助
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参考文献17

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同被引文献7

  • 1蔡茂世.Mg掺杂A1GaN的MOCVD生长及表征[M].西安:西安电子科技大学出版社,2011.
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  • 6XU Chengrui, HAO Yue. Stress and morphology of a nonpolar a - plane GaN layer on r - plane sapphire substrate [ J ]. China Physics B,2011,20(10) :107 -112.
  • 7许晟瑞,段焕涛,郝跃,张进城,张金凤,倪金玉,胡仕刚,李志明.(1■02)r面蓝宝石生长的(11■0)a面氮化镓研究[J].西安电子科技大学学报,2009,36(6):1049-1052. 被引量:3

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