考虑工艺波动的RC互连树统计功耗

Statistical power consumption of RC interconnect tree with process fluctuation

为了有效分析考虑工艺波动的RC互连树统计功耗,本文首先给出了考虑工艺波动的互连寄生参数和输入驱动点导纳矩的构建方法,然后,推导得出了互连功耗均值与标准差的表达式.计算结果表明,与目前广泛应用的Monte Carlo分析方法相比,采用本文方法得到的RC互连功耗均值误差小于4.36%,标准差误差则小于6.68%.结果显示,本文方法在确保精度的前提下大大缩短了仿真时间.

In order to effectively analyze the statistical power consumption of RC interconnect tree with process fluctuation,a method of constructing interconnect parasitic parameters and driving point admittance moments is first presented in this paper. Then,the expressions of mean and standard deviations of interconnect power consumption are obtained. The calculation results indicate that the errors of mean and standard deviations are less than 4. 36 % and 6. 68 % respectively compared with those calculated by the widely used Monte Carlo method. Results show that the proposed method has a good accuracy and high efficiency.