影响军用三极管芯片剪切强度可靠性的原因浅析

Simple Analysis for the Reliability of the Adhesion Strength of the Transistor Chip for Military Use

本文介绍了济南半导体所军用三极管的芯片剪切力的攻关过程及剪切强度的长期可靠性，重分析了影响剪切强度的各种因素。

This article introduced the course for solving the key problem of the adhesion strength of the transistor chip for military use in Jinan Semiconductor Institute,and the long-term reliability of the adhesion strength,mainly analysed variety of factors which can effect the adhesion strength.