指数分布下基于最低可靠寿命的抽样检验方案

Sampling inspection plans for exponential distribution with type Ⅰ censoring and limited by least sample lifetime

针对实际中一类不仅对合格品的平均寿命有要求,对失效品的寿命也有要求,即要求产品满足最低可靠寿命的抽样检验问题,在产品寿命服从指数分布前提下,以样本总试验时间为检验统计量,利用大样本下总试验时间的正态性质和中心极限定理,增加产品最低可靠寿命约束,推导出指数分布下基于产品最低可靠寿命的定时截尾抽样检验方案,给出了针对这类产品的抽样检验准则和方法。分析了抽样方案的检验特性,给出方案中各参数对检验效力和结果的影响;进行了模拟计算,结果显示双方风险相当,证实了该方法的可行性。

There is a kind of sampling inspection problem that both the standard lifetime for qualified items and the least lifetime for disqualified items should be considered.In this paper,the total testing time of samples with exponentially distributed lifetime was taken as the statistical variable.The sampling inspection plan was deduced in type Ⅰ censoring based on the least lifetime of items using the normal property in large sample and the central limit theorem with the constraints of the least lifetime added.The acceptance rules and operating method for the plan were also proposed.The plan characteristics were analyzed to study the influence of all plan parameters on testing effectiveness and results.Simulations validate the feasibility of the plan and show that the risks for both the users and manufacturers are equal.