摘要
单片机的很多应用都需要使用模/数转换器(ADC)进行测量。本文着重介绍C8051F系列单片机的AD转换子系统以及提高AD转换分辨率的方法,内容包括根据要增加的分辨率计算过采样率、根据要增加的SNR增加过采样率。并举实例介绍过采样和求均值的实现方法。
Many applications of MCU need using A/D converter to process measuring. We mainly introduced the ADC subsystem of C8051F and a method of improving the ADC resolution with it, including computing the oversam- pling ratio according to the resolution and adding oversampling ratio according to the SNR need to add. Finally a sample of the method of oversampling and evaluating mean-value is given.
出处
《信息化研究》
2011年第1期67-69,共3页
INFORMATIZATION RESEARCH