X射线荧光光谱法测定WC-TiC中钨、钛的质量分数

Determination of W and Ti in WC-TiC by X-ray Fluorescence Spectrometry

采用X射线荧光光谱(XRF)法对WC-TiC中钨、钛的质量分数进行了测定。根据WC-TiC中钨、钛元素的荧光强度和含量所具有的对应关系,经过校正拟合出钨、钛元素的实际工作曲线。对WC-TiC中钨、钛元素的测定结果与化学结果吻合,相对标准偏差(RSD,n=10)均在0.07%以下,完全能够满足生产的需要。

The method for determining mass fraction of W and Ti in WC-TiC sample by X-ray fluorescence spectrometry was introduced.Based on the correlations between XRF intensity and element concentration in W and Ti of WC-TiC sample,the matrix correction method was used to eliminate the influence of absorption and strengthening effects.The results obtained were in good agreement with chemical method.The relative standard deviation is less than 0.07%（n=10）.The method meets the production needs very well.