摘要
电感耦合等离子体原子发射光谱法测定硅青铜中硅、铁、锰和锌的含量。用盐酸、硝酸和氢氟酸溶解试样,过量的氢氟酸用饱和硼酸络合。选择251.61,238.20,257.61,206.20 nm等4条谱线依次作为硅、铁、锰、锌4种元素的分析线。由所加试剂引起的干扰通过空白试验予以消除,铜的基体干扰则在制作工作曲线时用基体匹配法予以消除。硅、铁、锰、锌的线性范围分别为0.10%~5.00%,0.10%~3.00%,0.10%~3.50%,0.10%~5.00%,检出限(3s)分别为0.39,0.29,0.24,0.45 mg.L-1,方法用于2个硅青铜标准样品分析,相对标准偏差(n=6)均小于0.1%。
ICP-AES was applied to the determination of Si,Fe,Mn and Zn in silicon bronze.The sample was dissolved in HCl,HNO3 and HF,and excess of HF was complexed by addition of sat′d.boric acid solution.Spectral lines of 251.61,238.20,257.61 and 206.20 nm were selected as analytical lines for Si,Fe,Mn and Zn respectively.Interference due to reagents used was eliminated by making blank test,and the matrix interference of copper was eliminated by the matching method in preparation of santadard working curves.Linearity ranges were obtained between 0.10%-5.00%(for Si),0.10%-3.00%(for Fe),0.10%-3.50%(for Mn) and 0.10%-5.00%(for Zn).Values of detection limit(3s) found were 0.39,0.29,0.24,0.45 mg·L-1 for Si,Fe,Mn and Zn respectively.Two standard samples were analyzed by the proposed method,giving values of RSD′s(n=6) less than 0.1%.
出处
《理化检验(化学分册)》
CAS
CSCD
北大核心
2011年第2期147-149,共3页
Physical Testing and Chemical Analysis(Part B:Chemical Analysis)