摘要
采用静态和动态两步测试比较，可以实现子模块电路板的脱机调试．该方法已在单元电路板的仿制过程中得到应用．
By comparing the two step testing of both static and dynamic,we can realize the off line debugging of the submodular circuit board.This method has already been used in the imitation procession of the unit circuit board.
出处
《内蒙古大学学报（自然科学版）》
CAS
CSCD
1999年第5期659-661,共3页
Journal of Inner Mongolia University：Natural Science Edition
基金
山东大学青年科学基金
