TD-LTE终端芯片关键技术测试及面临的挑战

TD-LTE Terminal Chipset Key Technology Testing and Challenge

TD-LTE终端芯片测试是促进TD-LTE终端芯片从开发初级阶段到产品技术较为成熟、系统较为稳定的有效手段之一。本文对TD-LTE终端芯片关键技术的测试内容、测试方法以及产品设计和测试所面临的挑战进行了介绍,指出终端芯片仍然是整个TD-LTE产业链相对薄弱的环节,推动终端芯片进一步完善需要芯片和终端产品开发、全面的调测验证以及完备的测试系统和仪表支持等多个环节的全面结合、协同推进。

The TD-LTE terminal chipset testing is an effective method to promote TD-LTE chipset to be more reliable and stable.The text gives a brief introduction about terminal chipset key technology testing,including the testing item,testing method,chipset problems and major challenges.Moreover,it indicates that chipset is still the weakest link in the TD-LTE industry and the development of terminal chipset needs the cooperation in terminal chipset designing,efficiently debugging and testing and fully support of test instruments.