摘要
光电成像系统由于欠抽样引起频谱混淆, 推导分析了包括均匀微扫描在内的非均匀微扫描方法在减少混淆方面的数学原理以及与亚像素位移之间的关系, 同时用计算机模拟实现了微扫描的一维和二维过程。
In the opto electric imaging system, aliasing will occur when sampling a scene containing spatial frequencies exceeding half of the sampling frequency. Microscanning is a potential method to reduce aliasing effect. Mathematical theory for microscanning based aliasing reduction, including non even cases, is analysed. Computer simulation of microscanning realization for both one and two dimensional cases is presented.
出处
《光学学报》
EI
CAS
CSCD
北大核心
1999年第9期1263-1268,共6页
Acta Optica Sinica
关键词
微扫描
光电成像系统
频谱混淆
欠抽样
microscanning, opto electric imaging system, aliasing, subsampling.