摘要
处理器离线测试广泛采用随机测试技术,但是随机测试技术生成大量测试代码,并且测试覆盖率不高;主要针对随机测试的不足,借鉴基于软件内建自测试方法建立处理器模块级于系统级功能模型,后分析功能模型可能发生错误,针对错误模型开发测试代码来提高错误覆盖率;经测试,模块级测试覆盖到所有功能点,达到功能模块100%测试,系统级的测试覆盖到SPARC V8的所有指令异常、正常测试用例;测试结果表明,所采取的测试方案对提高错误覆盖率是行之有效的。
Random test technology is widely used in processor off--line test, but Random test generate large amount of test code, and low fault coverage. The paper aim at shortage of random test, using software--based self--testing construct module level and system--level fault models of functional level, then analyse fault of functional models, and develop test code to improve fault coverage. By test, module testing coverage 100% module function, system-level testing coverage all the SPARC V8 instructions set and its exception, the normal test cases. Experimental results demonstrate that the test Method is fairly efficient for improving fault coverage.
出处
《计算机测量与控制》
CSCD
北大核心
2011年第3期512-515,共4页
Computer Measurement &Control
