期刊文献+

嵌入式变频扫描分析仪的设计

Design of Embedded Frequency Scanning Analyzer
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摘要 在设计开发,电路维修等领域,经常要测量电子元器件或电路模块的频率响应特性,而现有的测试仪器大多价格昂贵或是体积庞大,不能满足大多数用户的需求;针对以上问题,提出了一种基于ARM(CortexTM-M3内核单片机的嵌入式变频扫描分析仪;该仪器频率扫描速度可达到0.09ms/频点,频率范围可达到1MHz^100MHz,分辨率可达到100Hz;具有低成本、小型化和多功能等特点;用户可以直接在该仪器上修改并设置工作参数以满足各种不同的测试需求,同时该仪器还可以通过USB接口与计算机相连,并能够整合到其他自动测控系统中,实现自动测试功能。 In the area of developing, circuit repairing, the characteristic of frequent response of electronic component or circuit module is often measured. But the instruments nowadays are expensive or bulky, which can not satisfy the requirement of mass users. Aim at the prob lem mentioned above, this paper offered a kind of embedded frequency scanning analyzer, its kernel is based on ARM@ CortexTM- M3. The sweeping speed of the analyzer is 0.09ms/point, frequency range is 1MHz^100MHz and the resolution is 100Hz. The analyzer has the ad- vantage of low cost, miniaturization and multi--function. User can directly modify and set the working parameters on the analyzer to satisfy different requirements, and the analyzer also can connect to computer through USB, so it can be integrated into other automatic measurement and control system, to achieve automatic measurement purpose.
出处 《计算机测量与控制》 CSCD 北大核心 2011年第3期722-724,731,共4页 Computer Measurement &Control
关键词 ARM 扫描分析仪 自动测试 ARM scan analysor auto test
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参考文献5

  • 1Luminary Micro, Inc. LM3S5749 Microcontroller data sheet [EB/ OL] http: //www. luminarymiero, eom 2009. 10.
  • 2Philips, Inc. PESD5VOL6US data sheet [EB/OL]http: //www. nxp. corn 2009. 08.
  • 3Philips, Inc. PRTR5VOU2X data sheet [EB/OL] http: //www. nxp. eom 2008. 01.
  • 4Analog Devices, Inc. AD9852 data sheet [EB/OL] http.. //www. analog, com 2007. 05.
  • 5唐密媛,张根宝.基于ARM Cortex-M3的便携式智能瓦检仪的设计[J].计算机测量与控制,2009,17(12):2562-2563. 被引量:13

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