N路功率合成的失效分析

Failures in N-way Power Combining

随着国内半导体工艺水平的不断提高,固态合成功率放大器也开始大量的被应用到各种微波工程之中。目前国内多种固态合成功率放大器的产品皆以多路波导合成的方式获得大功率。在使用这些多路合成结构对大量功率器件进行功率合成时,一个或者多个器件的失效将对总体的输出功率造成多大的影响便成为了大家极其关心的性能指标。文章对固态功率合成器进行了理论的分析,通过计算推导出端口失效的模式。对两路合成器进行了仿真得到了失效50%会导致功率下降6dB的结论。并通过对八路波导合成功率放大器的失效模拟试验,验证了前面的计算分析。最后对试验中取得的数据进行比较分析得出了该数据在实际工程应用的作用。

Solid-State power combining amplifiers have been used in many microwave projects,since the development of domestic level of the semiconductor technology.Nowadays,most of the SSPAs get large power with the mutli-way combing structure.When these structures are used to combine power devices,the effects of the failure of one or more devices are becoming the most important figures.In This paper the theory of the Solid-State power combining is analyzed to obtain failure modes.A 2-way combiner is simulated to find the conclusion that power will decline 6dB when 50% ports are failed.The simulations are validated by the experimentation on the 8-Way waveguide combining Amplifier and the results are extended to the application in the engineering.