软X射线晶体标定系统研制

Development of a Soft X-ray Crystal Calibration System

研制了一套完整的软X射线晶体积分反射系数标定系统,包括针对CC224M软X射线源所设计的专用的晶体标定室、晶体与探测器的转动控制机构、复合真空及供气系统、作为标定探测器的流气式正比计数器等。在这一系统上开展了实验研究,获得了TAP晶体对Cu-Lα(13.33)、Al-Kα(8.32)两种入射波长的积分反射系数,验证了系统的有效性。

The integral reflection coefficient（Rc） of the flat crystal is an important parameter in X-ray spectroscopy diagnostics.A calibration system of soft X-ray crystal based on CC224M is developed and the details are introduced.The Rc of the TAP crystal for different incident wavelength as Cu-Lα（13.33） and Al-Kα（8.32） are acquired,therefore the validity of this system is testified.