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互补设计在Lee偏差下的均匀性 被引量：2

Uniformity in complementary designs in term of Lee discrepancy
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摘要 针对两类特殊的二、三混水平部分因子设计d=(D■),在适当的划分下分别给出了互补设计的Lee偏差与子设计D()的广义字长型和均匀性模式的解析关系,同时给出了Lee偏差的下界,最后通过两个例子来验证其结论. This paper considers two special kinds of designs d=（D｜D） with two and three mixed levels. Under a proper decomposition, it gives connections between uniformity measured by Lee discrepancy and generalized word length pattern or uniformity pattern for a pair of complementary designs d and presents a lower bound of Lee discrepancy of this kind of fractional factorials. Finally, two illustrative examples are given to shown our theoretical results.
作者 李洪毅 欧祖军
机构地区 吉首大学师范学院 吉首大学数学与计算机科学学院 华中师范大学数学与统计学学院
出处 《华中师范大学学报（自然科学版）》 CAS CSCD 北大核心 2011年第1期1-5,共5页 Journal of Central China Normal University：Natural Sciences
基金 国家自然科学基金(10671080) 教育部新世纪优秀人才支持计划项目(06-672) 湖南省教育厅科研项目(10C1091)
关键词 互补设计 Lee偏差 混水平因子设计 均匀设计 complementary design Lee discrepancy mixed level factorials uniform design
分类号 O212.6 [理学—概率论与数理统计]
  • 相关文献

参考文献7

  • 1FANG Kaitai QIN Hong.Uniformity pattern and related criteria for two-level factorials[J].Science China Mathematics,2005,48(1):1-11. 被引量：16
  • 2Qin H.Characterization of generalized aberration of some designs in terms of their complementary designs[J].J Stat Plann Infer,2003,117:141-151.
  • 3Luis B M,Carlos V A.Complete classification of (12,4,3)-RBIBDs[J].J Combin Designs,2001,9:385-400.
  • 4Zhang S L,Qin H.Minimum projection uniformity criterion and its application[J].Statist Probab Letters,2006,76:634-640.
  • 5Zhou Y D,Ning J H,Song X B.Lee discrepancy and its applications in experimental designs[J].Statist Probab Letters,2008,78:1933-1942.
  • 6Hickernell F J,Liu M Q.Uniform designs limit aliasing[J].Biometrika,2002,89:893-904.
  • 7Ma C X,Fang K T.A note on generalized aberration factorial designs[J].Metrika,2001,53:85-93.

二级参考文献1

  • 1Chang-Xing Ma,Kai-Tai Fang.A note on generalized aberration in factorial designs[J].Metrika.2001(1)

共引文献15

同被引文献12

  • 1FANG Kaitai QIN Hong.Uniformity pattern and related criteria for two-level factorials[J].Science China Mathematics,2005,48(1):1-11. 被引量：16
  • 2Hickernell F J, Liu M Q. Uniform designs limit aliasing[J]. Biometrika, 2002, 89:893-904.
  • 3Chatterjee K, Qin H. Generalized discrete discrepancy and its applications in experimental designs[J]. J Stat Plann In- fer,2011, 141: 951-960.
  • 4Qin H. Characterization of generalized aberration of some de- signs in terms of their complementary design [J]. J Stat Plann Infer, 2003, 117: 141-151.
  • 5Ma C X, Fang K T. A note on generalized aberration factori aldesigns[J]. Metrika,2001, 53: 85-93.
  • 6Zhang S L, Qin H. Minimum projection uniformity criterion and its application[J]. Statist Probab Letters, 2006, 76: 634-640.
  • 7Luis B M, Carlos V. A complete classification of (12,4,3)- RBIBDs[J]. J Combin Designs, 2001, 9 : 385-400.
  • 8HICKERNELL F J, LIU M Q. Uniform designs limit aliasing[ J]. Biometrika, 2002, 89:893 -904.
  • 9CHATFERJEE K, QIN H. Generalized discrete discrepancy and its applications in experimental designs [ J ] cal Planning and Inference, 2011, 141:951 -960.
  • 10QIN H. Characterization of generalized aberration of some designs in terms of their complementary design[ J] cal Planning and Inference, 2003, 117 : 141 - 151.

引证文献2

华中师范大学学报（自然科学版）
2011年 第1期

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