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基于Wiener过程的步进应力加速退化建模 被引量:7

Step-stress accelerated degradation modeling based on Wiener process
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摘要 在现有的步进应力加速退化试验中,应力水平的改变时间通常被事先确定,这对高可靠性产品存在一定的不合理性。用Wiener过程描述产品性能退化轨道,在试验中当产品性能退化到某一阈值时,改变其应力水平,从而产品的应力水平改变时间是服从逆高斯分布的随机变量。基于该情形建立产品的步进应力加速退化模型。考虑到模型的计算复杂性,采用贝叶斯马尔科夫链蒙特卡罗方法获取模型参数的极大似然估计,最后通过仿真试验验证文中的模型和方法。 During the step-stress accelerated degradation test(SSADT) experiment,the time of changing stress level is usually determined in advance.It may be unreasonable to highly reliable products.The degradation path is described as a Wiener process.During the experiment,the stress level is changed when the degradation value crosses a pre-specified value.Therefore,the time of changing stress level is regarded as a random variable which follows inverse Gaussian distribution.Based on this situation,an SSADT model is proposed.Due to the computational complexity of the model,the Bayesian Markov chain Monte Carlo(MCMC) method for the parameters is applied to obtain the maximum likelihood estimation.Finally,some simulation examples are presented to validate the proposed model and method.
出处 《系统工程与电子技术》 EI CSCD 北大核心 2011年第4期963-968,共6页 Systems Engineering and Electronics
基金 国家自然科学基金(60701006)资助课题
关键词 加速退化建模 WIENER过程 步进应力 贝叶斯马尔科夫链蒙特卡罗方法 accelerated degradation modeling Wiener process step-stress Bayesian Markov chain Monte Carlo(MCMC) method
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参考文献22

  • 1Carey M B, Koenig R H. Reliability assessment based on accelerated degradation: a case study[J]. IEEE Trans. on Reliability, 1991 ,40 (5) :499 - 506.
  • 2Tang L C, Chang D S. Reliability prediction using nondestructive accelerated degradation data: case study on power supplies[J]. IEEE Trans. on Reliability, 1995,44(4) : 562 - 566.
  • 3Whitmore G A, Schenkelberg F. Modeling accelerated degradation data using Wiener diffusion with a time scale transformation[J] Lifetime Data Analysis, 1997,3(1) :27 - 45.
  • 4Meeker W Q, Escobar L A. Accelerated degradation tests: mod- eling and analysis[J]. Technornetrics, 1998,40 (2) : 89 - 99.
  • 5Shiau J H, Lin H H. Analyzing accelerated degradation data by nonparametric regression [J]. IEEE Trans. on Reliability, 1999,48(2):149 - 158.
  • 6Owen W J, Padgett W J. Accelerated test models for system strength based on Birnbaum Saunders distributions[J]. Life- time Data Analysis, 19 9 9,5 (2) : 13 3 - 14 7.
  • 7Onar A, Padgett W J. Accelerated test models with the inverse gaussian distribution[J]. Journal of Statistical Planning and Inference,2000,89(1 - 2) :119 - 133.
  • 8Padgett W J, Tomlinson M A. Inference from accelerated degra- dation and failure data based on Gaussian process models[J]. Lifetime Data Analysis ,2004,10(2) : 191 - 206.
  • 9Park C, Padgett W J. Accelerated degradation models for failure based on geometric Brownian motion and gamma processes[J]. Lifetime Data Analysis, 2005,11 (4) : 511 - 527.
  • 10Park C, Padgett W J. Stochastic degradation models with sev- eral accelerating variables[J]. I EEE Trans. on Reliability, 2006,55(2) :379 - 390.

二级参考文献7

  • 1Nelson W.Accelerated testing:statistical methods,test plans,and data analysis[M].New York:John Wiley Press,1990.
  • 2Meeker W Q,Escobar L A,Lu J C.Accelerated degradation tests:modeling and analysis[J].Technometrics,1998,40(2):89-99.
  • 3Chang D S.Analysis of accelerated degradation data in a two-way design[J].Reliability Engineering and System Safety,1993,39:65-69.
  • 4Tseng S T,Wen Z C.Step-stress accelerated degradation analysis for highly reliable products[J].Journal of Quality Technology,2000,32(3):209-216.
  • 5Park S J,Yum B J,Balamurali S.Optimal design of step-stress degradation tests in the case of destructive measurement[J].Quality Technology & Quantitative Management,2004,1(1):105-124.
  • 6Liao C M,Tseng S T.Optimal design for step-stress accelerated degradation tests[J].IEEE Transactions on Reliability,2006,55(1):59-66.
  • 7邓爱民,陈循,张春华,汪亚顺.加速退化试验技术综述[J].兵工学报,2007,28(8):1002-1007. 被引量:53

共引文献13

同被引文献76

  • 1陈玉波,于永利,张柳,聂成龙.多阶段任务系统(PMS)可靠性模型研究[J].系统工程与电子技术,2006,28(1):146-149. 被引量:10
  • 2巴恒静,张武满.混凝土寿命加速实验方法与预测[J].硅酸盐学报,2007,35(2):242-246. 被引量:5
  • 3邓爱民,陈循,张春华,汪亚顺.加速退化试验技术综述[J].兵工学报,2007,28(8):1002-1007. 被引量:53
  • 4姜同敏,王晓红,等.可靠性试验技术[M].北京:北京航空航天大学出版社,2012.
  • 5LEI H, NADARAJAH N. An accelerated test method for predic- ting the useful life of an LED driver [ J ]. IEEE Transaction on Power Electronics, 2011, 26 (8) : 2249 - 2257.
  • 6LI X P, CHEN L, CHEN M. An approach of LED lamp system li- fetime prediction [ C ]//2011 IEEE International Conference on Quality and Reliability, September 14 - 17, 2011 , Bangkok. 2011:110 -114.
  • 7PENG C Y, TSENG S T. Progressive stress accelerated degrada- tion test for highly reliable products[ J]. IEEE Transaction on Re- liability, 2010, 59( 1 ) :30 -36.
  • 8PETTIT L I, YOUNG K D S. Bayesian analysis for inverse Gaussi- an lifetime data with measures of degradation[J]. Journal Statisti- cal Computation and Simulation, 1999, 63 (3) :217 - 234.
  • 9PARK C, PADGETT W J. Accelerated degradation models for failure based on geometric Brownian motion and gamma processes [J]. Lifetime Data Analysis, 2005, ll(4) :511 -527.
  • 10WHITMORE G A. Estimating degradation by a Wiener diffusion process subject to measurement error[ J]. Lifetime Data Analysis, 1995, 1 (3) :307 -319.

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