摘要
采用 X-射线衍射(XRD)和 X-光电子能谱(XPS)研究了镍-钨合金电沉积层的结构。结果表明,含钨量小于37.2% 的镍-钨合金电沉积层晶格为面心立方F,是固溶体结构和(111)择优取向,镍与钨均以金属单质形式存在于合金镀层中;含钨量小于43.7% 的镍-钨合金电沉积层属于金属化合物结构,其原子比为4∶1。显微硬度测定表明,具有金属化合物结构的镍-钨合金电沉积层的显微硬度最大。
The structure of Ni\|W alloy deposit wes studied by XRD and XPS. The XRD results showed that the Ni\|W alloy deposit is in the structure of FCC solid solution with (111) preferred orientation. The lattice constant and microhardness of Ni\|W alloy deposit increase as W content decreases. XPS results of Ni\|W alloy deposits indicate that the atomic ratio of Ni and W is 4∶1, so β\|Ni\|W alloy can be obtained by electrodeposition and its micro hardness is as high as 672.8 HV
出处
《材料保护》
CAS
CSCD
北大核心
1999年第10期18-19,共2页
Materials Protection
基金
国家自然科学基金!资助项目
项目批准号:29773039