摘要
主要介绍了基于CPLD技术设计了新型数字集成芯片检测仪的设计,采用ARM控制芯片LPC2136完成端口检测状态和上位机测试矢量的收集,通过USB接口与上位机通信,在线或离线对常用数字集成芯片的型号做识别、故障分析和定位。该系统扩展性强,既可对未知型号芯片进行检测,也可对逻辑电平进行检测,应用灵活而广泛。
This paper introduced the design of new digital integrated chip detector based on CPLD,collecting detection status of ports and test vectors of host computer.The detector can also identify the model,and analyze the faults and orientation on or off line,and the USB interface used for communicating with the host computer.The system is scalable and flexible,can be used as the detection of unknown type chips,as well as a logic level detector.
出处
《仪表技术与传感器》
CSCD
北大核心
2010年第7期37-38,68,共3页
Instrument Technique and Sensor
基金
成都理工大学青年科学基金资助项目(2009QJ28)
关键词
集成电路
状态检测
ARM
芯片检测
接口扩展
integrated circuit
stateful inspection
ARM
chip detection
interface expansion