摘要
实现了基于可满足性(SAT)求解的方法,以解决固定型和时延故障的自动测试向量生成问题。详细讨论了如何利用电路的拓扑结构以及从ATPG到合取范式(CNF)的编码方法。CNF被输入到一个高效的SAT求解器zchaff中求解。在ISCAS85测试实例中验证了该算法的有效性。
Automated test pattern generation(ATPG) algorithms for both stuck-at and delay faults were implemented based on satisfiability(SAT) solving.Topology of the circuits was discussed in detail,as well as encoding ATPG problems into conjunctive normal forms(CNFs),which were solved by zchaff,an efficient Boolean SAT solver.The proposed algorithms were tested using a set of ISCAS85 benchmarks to demonstrate their effectiveness.
出处
《微电子学》
CAS
CSCD
北大核心
2011年第2期230-234,共5页
Microelectronics
基金
国家自然科学基金资助项目(60673034)
北京交通大学科技基金资助项目(2007XM011
2008RC002)
关键词
测试向量自动生成
可满足性
故障字典
延迟故障
Automatic test pattern generation(ATPG)
Satisfiability
Fault dictionary
Delay fault