用于复杂数字系统测试的整体功能模型

A GLOBAL FUNCTION MODEL FOR DIGITAL SYSTEM TESTING

运用《系统论》的思想，提出数字系统功能和复杂数字系统整体功能的概念，由此引伸出功能测试的新方法．这种方法可归结为通过复杂数字系统的分析，包括拓扑分析和逻辑分析，建立整体功能模型，据此找出验证测试所需的系统输入向量序列．这些工作可采用计算机辅助手段，特别是运用《算法图论》和逻辑综合工具而完成的．用所提出的方法可以在复杂数字系统各种不同抽象级的逻辑图中提取整体功能模型，因此具有广泛的适用性．

According to the philosophy of systematicism, the concept of global function of complex digital systems is proposed. Then a novel approach of test generation is introduced. This approach may be summarized as a two step process. The first is to extract the global function model by topological analysis and logical analysis of the complex digital system, and the next is to find the input vector sequence for verifying this model. These procedures can be accomplished with computer aided tools based on algorithmic graph theory and logic synthesis. This approach facilitates the practical solution of VLSI test generation and is adaptable to digital systems described in different levels of abstraction.