摘要
用掠角 Ｘ 射线衍射并结合电子探针及透射电子显微镜，研究了渗钒层不同深度的结构信息，发现渗钒层由表及里晶粒由细逐渐变粗，并证实了应用传统的 Ｘ 射线衍射方法产生的α Ｆｅ 的峰是来自衬底的干扰。
The structure message of vanadized layer at different depth was studied with x ray diffraction methed and TEM. The results showed that,crystal grains of vanadized layer were becoming finer gradualy from inside to outside,and confirmed that the differaction peak of α Fe in CBD methed is caused by the base materials.
