期刊文献+

基于电阻应变的无铅焊点损伤临界点在线检测 被引量:1

Detection Damage on Critical Point of Lead-free Solder Joint Based on Resistance Strain
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摘要 蠕变损伤是引起焊点失效的重要因素,传统的蠕变测试方法不能实时的测得无铅焊点的蠕变损伤临界点。研究表明,焊点的蠕变损伤与其电阻变化存在着线性关系。本文利用特制的无铅焊点微电阻在线测量系统,实时监测焊点在蠕变过程中的电阻变化,并利用二次移动平均法建立焊点电阻的预测模型,通过对比预测电阻值与实测值的差异,实时判断出焊点的损伤临界点,为蠕变测试研究提供了一种新的方法。 The damage caused by creep is an important factor in the failure of solder joints.It is difficult to detect the damage critical point in creep process by traditional methods in real-time test.The experiment results show that there is linear relationship between the solder joint creep damage and its resistance changes.An electronic testing system was set up to test the resistance of solder joint in creep process.Then,a forecasting model for the resistance was established by double moving average method,the predicted value was compared with the measured value,and then the damage critical point can be identified in real-time test.This provides a new approach for the creep study of solder joint.
出处 《热加工工艺》 CSCD 北大核心 2011年第5期146-149,共4页 Hot Working Technology
关键词 无铅焊点 蠕变 电阻应变 损伤临界点 二次移动平均法 lead-free solder joint creep resistance strain damage critical point double moving average method
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参考文献6

  • 1McDougall J, Choi S, Bieler T R, et cd. Quantification of creep strain distribution in small crept lead-free in-situ composite and non composite solder joints [J]. Materials Science and Engineering, 2000, A285:25-34.
  • 2Lau K J, Tang C Y, Chow C L, et ol. Microscopic experimental investigation on shear failure of solder joints [J]. International Journal of Fracture, 2004, 130: 617-634.
  • 3蒋礼,杨科灵,周孑民,向可,王文杰.在线测量Sn-3.5Ag焊点蠕变的电阻应变[J].中南大学学报(自然科学版),2008,39(1):80-85. 被引量:7
  • 4Choi S, Lee J G, Guo F, et d. Creep properties of Sn-Ag solder joints containing intermetallic particles[J]. JOM, 2001, 5(6): 22-26.
  • 5廖福平,周浪,黄惠珍,严明明.无铅电子钎料合金蠕变性能研究[J].电子元件与材料,2005,24(4):65-67. 被引量:9
  • 6蒋礼,刘方林,周孑民,陈晓敏,王天云.基于电阻应变临界点的无铅焊点失效分析[J].电子元件与材料,2009,28(7):68-72. 被引量:4

二级参考文献32

  • 1李晓延,王志升.倒装芯片封装结构中SnAgCu焊点热疲劳寿命预测方法研究[J].机械强度,2006,28(6):893-898. 被引量:10
  • 2魏鹤琳,王奎升.球栅阵列器件焊接合格率预测及缺陷分析[J].电子元件与材料,2007,26(5):62-65. 被引量:1
  • 3吴丰顺,张伟刚,张金松,吴懿平.无铅互连凸点电迁移失效的四探针测量[J].华中科技大学学报(自然科学版),2007,35(6):85-88. 被引量:4
  • 4Choi K S, Choi S, Kim Y G, et al. Solder joint reliability of the BLP (Bottom-Leaded Plastic) package [J]. Proc Semicond Korea, 1997, (2): 63--73.
  • 5Lau H J, Lee R S W. Chip Scale Package, CSP: design, materials, process, reliability, and applications [M].USA: McGraw-Hill Companies, Inc, 1999: 369.
  • 6Wang Z P, Tan Y M, Chua K M. Board level reliability assessment of chip scale packages [J]. Microelectron Reliab, 1999, 39:1351 -- 1356.
  • 7Frank S. Failure criteria of flip chip joints during accelerated testing [J]. Microelectron Reliab, 2002, 42:1921 -- 1930.
  • 8IPC-association connecting electronics industries, performance and reliability test methods for flip chip, chip scale, BGA and other surface mount array package applications [M]. USA: IPC, 2000.
  • 9McDougali J, Choi S, Bieler T R, et al. Quantification of creep strain distribution in small crept lead-free in-situ composite and non composite solder joints [J]. Mater Sci Eng, 2000, A285: 25--34.
  • 10Li J, Yang K L, Zhou J M, et al. Quantification of creep strain in small lead-free solder joints with the in-situ micro electronic-resistance measurement [J]. Microelectron Reliab, 2008, 48(3): 438--444.

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