摘要
在电弧法制备的过程中添加氮气或B2O3 粉末,制备了氮、硼替位式掺杂C60 。硼掺杂和氮掺杂C60 均显示明显的半导体导电特性,且室温电导率比未掺杂C60 薄膜提高1 ~2 个量级。用共蒸发的方法制备出了硫掺杂C60 薄膜,其电导率~温度曲线中存在一个过渡区,过渡区两侧表现出明显的半导体导电特性,这与掺入C60 薄膜中的硫杂质的存在状态有关。其室温电导率比掺杂前提高4个量级,光致发光也明显增强。另外还报道了用离子注入和射频等离子体辅助真空沉积的方法制备掺杂C60 薄膜的初步结果。
The boron doped and nitrogen doped C 60 thin films were prepared by arc discharge.The electrical transport behavior with the obvious semiconductive property has been shown in the boron doped and nitrogen doped C 60 films.The conductivity and activation energy of both doping C 60 films change little compared with that of pristine C 60 film.The sulfur doped C 60 films were deposited by simultaneous evaporation.The semiconductive property has also been confirmed from the room temperature to 368K and above 388K.A transition in the curve of conductivity versus temperature has been found at 368—388K,which could be attributed to the structure change of the sulfur.The conductivity increased by four orders of magnitude and photoluminescence was enhanced greatly.The initial investigations on preparation of doping C 60 films by ion implantation and RF plasma chemical vapor deposition were also reported.
出处
《人工晶体学报》
EI
CAS
CSCD
北大核心
1999年第4期359-363,共5页
Journal of Synthetic Crystals
基金
北京市自然科学基金
北京市青年科技骨干基金
北京市跨世纪优秀人才计划资助
关键词
掺杂
电导率
碳60
光电性
薄膜
半导体
C_(60) ,doping,conductivity,arc discharge method,ion implantation,RF plasma chemical vapor deposition