摘要
随着现代电子测试技术、微电子技术、计算机技术的发展,自动测试系统也随着复杂电子装备的需求而不断发展,通用自动测试系统是自动测试系统今后发展的必然方向。简要介绍了自动测试系统的发展概况,通过对通用自动测试系统特点的分析,提出了"架构层"、"语法层"和"语义层"通用自动测试系统的概念,并讨论了涉及下一代通用自动测试系统的关键技术及应用方向,为通用自动测试系统的研究指明了方向。
With the development of modem electronic testing technology,microelectronics and computer technology, Automatic Test System （ATS） is also promoted by the test demand of the complex electronic equipments,and General Purpose Automatic Test System （GPATS） is the inevitable direction of future ATS.An overview is given to the development of ATS. By the analysis of the character of GPATS,the concepts of ＂framework layer＂, ＂syntax layer＂ and ＂semantic layer＂ are proposed,and the key technologies and application directions involved in the next generation GPATS are discussed, what＇s more, the research direction forward is also pointed out.
出处
《电子设计工程》
2011年第9期160-162,169,共4页
Electronic Design Engineering
