2Bemieri A,Betta G,Ferrigno I.,et al. A Biaxial Probe for Nondestructive Testing on Conductive Materials [J]. IEEE Transactions on Instrumentation and Measure ment,2004,53(3):678 -684.
7Saeed Moaveni.Finite element analysis theory and application with ANSYS[M].北京:电子工业出版社,2003.
8Daniel J, Sadler, Chong H, Ahn. On-chip eddy current sensor for proximity sensing and crack detection[J]. Sensors and Actuators A, 2001, 91: 340-345.
9Mitsuru Uesaka, Kazumi Hakuta, Kenzo Miya, etal. Eddy-Current Testing by Flexible Microloop Magnetic Sensor Array[J]. IEEE transaction on magnetics, 1998, 34(4): 2287-2297.
10Shao K R, Guo You Guang, and Lavers J D. Multiresolution Analysis for Reconstruction of Conductivity Profiles in Eddy Current Nondestructive Evaluation Using Probe Impedance Data[J]. IEEE transactions on magnetics, 2004, 40(4): 2101-2103.