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多层膜聚光镜对Schwarzschild显微镜成像均匀性的影响

Influence of multilayer films condenser on imaging uniformity of Schwarzschild microscope
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摘要 提出了利用多层膜聚光镜提高Schwarzschild显微镜成像均匀性的方法。设计了聚光镜的光学结构,使80%的等离子体辐射能量会聚在约0.8 mm直径的范围内。根据成像系统的工作波长和光线在聚光镜表面的入射角度,设计了Mo/Si周期多层膜,制备了聚光镜光学元件,膜层周期厚度为9.64 nm,周期数为30,对18.2 nm波长的峰值反射率为51.7%。利用所设计的聚光镜作为照明系统,对Schwarzschild物镜进行了网格成像实验。结果表明:在1.2 mm视场内可以实现2.5μm的空间分辨力,并且完全消除了物镜中心遮拦所造成的像面光强分布不均匀性。 The method for improving the uniformity of the image using multilayer films condenser is proposed.The optical structure of the condenser is designed,which concentrates 80% energy radiated by plasma to about 0.8 mm diameter range.Based on the system's wavelength and incidence angle of light,the Mo/Si multilayer films with period of 9.64 nm and layers of 30 is designed and the coatings are deposited with magnetron sputtering.The reflectivity of optical elements at 18.2 nm is 51.7%.The grid backlit by EUV rays focused using condenser is imaging via Schwarzschild microscope on CCD.The results show that spatial resolution of 2.5 μm can be achieved in the 1.2 mm field,and the non-uniformity of image caused by the obscuration of objective is eliminated absolutely.
出处 《强激光与粒子束》 EI CAS CSCD 北大核心 2011年第5期1259-1263,共5页 High Power Laser and Particle Beams
基金 国家自然科学基金项目(10825521,10773007) 上海市科学技术委员会科研计划项目(0952nm06900)
关键词 Schwarzschild显微镜 激光等离子体 聚光镜 MO/SI多层膜 空间分辨力 Schwarzschild microscope laser produced plasma condenser Mo/Si multilayer films spatial resolution
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参考文献8

  • 1Seward F D, Palmieri T M. A simple X ray microscope for photographing laser produced plasma[J]. RevSci Instrum, 1975, 46(2): 204-206.
  • 2Marshall F J, Su Qichang. Quantitative measurements with X ray microscope in laser fusion experiments[J]. Rev Sci Instrum, 1995, 66 (1):725 -727.
  • 3Marshall F J, Bennett G R. A high-energy X ray microscope for inertial confinement fusion[J]. Rev Sci lnstrum, 1999, 70(1):617-619.
  • 4Seely J F, Holland G E, Giasson J V, et al. High-resolution imaging of laser-produced plasma at a wavelength of 130 A by a normal inci dence multilayer-mirror microscope[J]. Appl Opt, 1993, 32(31) : 6294 -6302.
  • 5Seely J F, Holland G E, Boehly T. Uniformity of the soft-X-ray emissions from gold foils irradiated by OMEGA laser beams determined by a two-mirror normal-incidence microscope with multilayer coatings[J]. Appl Opt, 1998, 37(7) : 1140-1145.
  • 6Benattar R, Godart J, Bridoux F, et al. A Schwarzschild microscope to study the preheat of laser heated targets[C]//Proc of SPIE. 1986, 688:171 -175.
  • 7王新,穆宝忠,黄怡,翟梓融,伊圣振,蒋励,朱京涛,王占山,刘红杰,曹磊峰,谷渝秋.等离子体诊断用18.2nm Schwarzschild显微镜[J].强激光与粒子束,2011,23(3):647-651. 被引量:5
  • 8Marshall F J, Allen M M, Knauer J P, et al. A high resolution X-ray microscope for laser driven planar foil experiments[J]. Rev Sci Instrum, 1998, 75(4) : 1118-1124.

二级参考文献17

  • 1蔡达锋,谷渝秋,郑志坚,周维民,焦春晔,温天舒,淳于书泰.飞秒激光-薄膜靶相互作用中超热电子产额和激光转化效率[J].强激光与粒子束,2005,17(1):37-41. 被引量:4
  • 2王占山,曹健林,陈波,马月英,陈斌,张俊平,王兆岗,高宏刚,吕俊霞,陈星旦.18.2nm Schwarzschild显微成像系统初步研究[J].光学学报,1996,16(4):531-536. 被引量:4
  • 3Richardson M, Sbinohara K, Tanaka K A, et al. Pulsed X ray microscopy of biological specimens with laser plasma sources[C]//Proc of SPIE. 1992, 1741:133-141.
  • 4Tichenor D A, Kubiak G D, Stulen R H, et al. Diffractionlirnited soft Xray projection imaging using a laser plasma source[J]. Opt Lett,1991, 16:1557-1559.
  • 5Tichenor D A, Kubiak G D, Malinowski M E, et al. Development of a laboratory extreme ultraviolet lithography tool[C]//Proc of SPIE. 1994, 2194:95-105.
  • 6Nagata H, Ohtani M, Murakami K, et al. Fabrication of 0.1 pm lineandspace patterns using soft Xray reduction lithography[J]. Jpn J Appl Phys, 1994, 33:360-363.
  • 7Richard H S. 13nm extreme ultraviolet lithography[J]. IEEEJournal of Selected Topics in Quantum Electronics, 1995, 1(3) :970-975.
  • 8Benattar R, Godart J, Bridoux F, et al. A Schwarzschild microscope to study the preheat of laser heated targets[C]// Proc of SPIE. 1986, 688 : 171-175.
  • 9Seely J F, Holland G E, Giasson J V, et al. High resolution imaging of laserproduced plasma at a wavelength of 130 A by a normalinci dence multilayermirror microscope[J]. Appl Opt, 1993, 32 (31) : 6294-6302.
  • 10Seely J F, Holland G E, Boehly T. Uniformity of the softXray emissions from gold foils irradiated by OMEGA laser beams determined by a twomirror normalincidence microscope with muhilayer eoatings[J]. Appl Opt, 1998, 37(7):1140-1145.

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