期刊文献+

基于无线数据传输的爆炸场温度测试系统的研究

Study on Explosion Field temperature Testing System Based on Wireless Data Transmission
下载PDF
导出
摘要 准确测量炸药爆炸时产生的瞬态高温值,可以为武器研制过程中的爆炸类别判定、威力对比、性能评价提供依据。针对当前爆炸场温度测量中存在通用测试系统布设不方便、存储测试系统需要回收读数的问题,设计了应用于爆炸场温度测量的无线传感器系统。该系统基于PIC16F877A微控制器,CPLD复杂可编程逻辑器件以及nRF24L01无线传输芯片的传感器系统,采用钨铼热电偶作为温度测量端,DS600高精度模拟温度传感器对冷端进行温度补偿。系统具有布设方便、高速采集、触发及工作参数可调的特点,已成功应用于某型测试系统当中。 The accurate measurement of the transient temperature value produced by explosive blasting may provide the basis for distinguishing the types of the explosive, the power contrast of the explosive and the performmace evaluation in the Weapons research process. To solve the problems of the Universal Test System emplaced inconveniently and the stored testing system need to be recycled, it has designed the explosion field application in wireless sensor system of temperature measurement. The system based on PIC16FS77A micro controller, CPLD complex prograrrmmble logic devices and nRF24L01 wireless transmission chip sensor. The system adopts the Tungsten - Rhenium Thermoeouple as the temperature sensor, DS600 temperature sensor for cold temperature compensation. This system has arrangement convenient, high - speed data acquisition, trigger and working parameters of adjustable characteristics, has been successfully applied in a test system.
出处 《核电子学与探测技术》 CAS CSCD 北大核心 2011年第4期462-465,478,共5页 Nuclear Electronics & Detection Technology
关键词 钨铼热电偶 冷端补偿 CPLD 单片机 无线数据传输 Tungsten -Rhenium thermocouple, Cold Junction Compensation, CPLD, SCU,wireless data transmission
  • 相关文献

参考文献5

二级参考文献15

  • 1何瑛,朱明武,李永新.膛内多路瞬态信号存储测试技术[J].仪器仪表学报,2001,22(z2):134-136. 被引量:16
  • 2祖静,申湘南,张文栋.存储测试技术[J].兵工学报,1994,15(4):30-34. 被引量:63
  • 3王俊杰.存储测试技术多次重触发技术的研究[J].华北工学院学报,1996,17(2):127-132. 被引量:4
  • 4陈丽娟,常丹华.基于nRF2401芯片的无线数据通信[J].电子器件,2006,29(1):248-250. 被引量:64
  • 5董健.[D].北京:北京理工大学,2004.17-56.
  • 6Dong Jian, Jiang Jianwei, Wan Lizhen. Study on Dynamic Memorized Testing Technology for Ammunition Explosion Shockwave Overpressure Measurement [A]. In: T. D. Wen. the 5th International Symposium on Test and Measurement [C]. Shnezhen: International academic publishers world publishing corporation, 2003, (2): 920- 924.
  • 7XILINX.Spartan-3 platform FPGA handbook[EB/OL],http://www.xilinx.com,2003.
  • 8Samsung.K9F1G08UOM K9F1G16UOM flash memory datasheet rev.13[EB/OL],http://www.sumsung.com,2003.
  • 9Samsung.NAND flash spare assignment recommendation[EB/OL ],http://www.sumsung.com,2003.
  • 10TOSHIBA,What is NAND flash memory? [EB/OL],http://www.toshiba.com,2003.

共引文献137

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部