故障分类时顺序约束指数可靠性增长的Bayes精确限

Exact Bayesian Limits for Ordered Constraint Exponential Reliability Growth with Classified Failure

按ＩＥＣ１０１４，将研制试验中产品的故障分为Ａ型与Ｂ型，对研制试验的所有阶段，Ａ型故障服从失效率λ０的指数分布，阶段ｉ的Ｂ型故障服从失效率λｉ 的指数分布，若产品仅引入延缓纠正，则λｉ 非增，即满足顺序约束条件：λ１ ≥λ２≥…≥λｍ ，基于此条件，在取共轭型与无信息先验分布时，本文推导了研制试验最后阶段的失效率λ＝ λ０ ＋ λｍ 与可靠性Ｒ（ｔ）＝ ｅ－ λｔ（ｔ是任务时间）的Ｂａｙｅｓ精确限。

According to IEC1014, the failures of the product under development and test are divided into A-and B-type. A-type failure follows the exponential distribution with failure rate λ 0 for all phases of development and test. B-type failure of the ith phase (i=1,2,…,m)follows the exponential distribution with failure rate λ i. If the delayed modifications are incorporated only, then λ i is non-increased, i.e.λ i satisfy following ordered constraint condition: λ 1≥λ 2≥…≥λ m Based on the condition, and taking the conjugate and noninformative prior distribution, the exact Bayesin limits of the failure rate λ=λ 0+λ m and the reliability R(t)=e -λt (tis the mission time) of last phase of development and test of the product are derived.