摘要
用X射线光电子能谱（XPS）分析了沉积在北京中关村地区不同物体表面的大气颗粒物。结果表明颗粒物表面的主要元素成份为S、N、C、O、Si、Al、Ca和Cl，其中含N和含S化合物为主要污染物。硫主要以硫酸盐或吸附的高价硫氧化物存在，氮则有多种化学态包括氨基和铵类氮、N－O化合物和硝酸盐类氮存在。2007年4月份采集的颗粒物表面的氮的相对原子百分比高于硫，但12月份采集的室外颗粒物表面的硫的相对原子百分比则高于氮。本研究显示XPS是研究大气颗粒沉积物的有效方法之一。
XPS has been used to analyze air particles deposited on different objects in Zhongguancun area in Beijing. The results show that the elemental compositions of particle surfaces are mainly S, N, C, O, Si, A1, Ca and CI, in which N- and S- containing compounds are the major pollutant. The chemical states of S are identified largely as sulfate. At least three chemical states of N are present, i. e. amino-type N, ammonium N or adsorbed N-O oxide and nitrate N. For the particle samples collected in April, 2007, the relative atomic percentage of N is higher than that of S; for the samples collected in December in 2007, however, the relative atomic percentage of N is lower than that of S. The present work demonstrates that XPS is an effective method for analysis of air particle pollutants.
