摘要
This paper investigates the photon tunneling and transmittance resonance through a multi-layer structure including a left-handed material（LHM）. An analytical expression for the transmittance in a five-layer structure is given by the analytical transfer matrix method. The transmittance is studied as a function of the refractive index and the width of the LHM layer. The perfect photon tunneling results from the multi-layer structure, especially from the relation between the magnitude of the refractive index and the width of the LHM layer and those of the adjoining layers. Photons may tunnel through a much greater distance in this structure. Transmittance resonance happens, the peaks and valleys appear periodically at the resonance thickness. For an LHM with inherent losses, the perfect transmittance is suppressed.
This paper investigates the photon tunneling and transmittance resonance through a multi-layer structure including a left-handed material（LHM）. An analytical expression for the transmittance in a five-layer structure is given by the analytical transfer matrix method. The transmittance is studied as a function of the refractive index and the width of the LHM layer. The perfect photon tunneling results from the multi-layer structure, especially from the relation between the magnitude of the refractive index and the width of the LHM layer and those of the adjoining layers. Photons may tunnel through a much greater distance in this structure. Transmittance resonance happens, the peaks and valleys appear periodically at the resonance thickness. For an LHM with inherent losses, the perfect transmittance is suppressed.
基金
Project supported by the National Natural Science Foundation of China (Grant Nos. 60877055 and 60806041)
the Innovation Funds for Graduates of Shanghai University,China (Grant No. SHUCX102016)
