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Influencing factors of microscanning performance based on flat optical component 被引量：1

Influencing factors of microscanning performance based on flat optical component
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摘要 To decrease the performance difference between the actual microscanning thermal imager and the theoretical value, a germanium lens （placed at a certain angle between the infrared focal plane array and infrared lens） dip angle model of flat optical component microscanning is introduced in this letter. The model is the basis for choosing the dip angle of the germanium lens, which is used in the microscanning thermal imager. In addition, the actual dip angle of the germanium lens is chosen according to the model, the infrared lens parameters of the thermal imager, and the germanium lens parameters of manufacture and installation. Only in this manner can the optimal performance of the microscanning thermal imager based on the flat optical component be obtained. Results of the experiments confirm the accuracy of the conclusions above. To decrease the performance difference between the actual microscanning thermal imager and the theoretical value, a germanium lens （placed at a certain angle between the infrared focal plane array and infrared lens） dip angle model of flat optical component microscanning is introduced in this letter. The model is the basis for choosing the dip angle of the germanium lens, which is used in the microscanning thermal imager. In addition, the actual dip angle of the germanium lens is chosen according to the model, the infrared lens parameters of the thermal imager, and the germanium lens parameters of manufacture and installation. Only in this manner can the optimal performance of the microscanning thermal imager based on the flat optical component be obtained. Results of the experiments confirm the accuracy of the conclusions above.
作者 隋修宝 柏连发 陈钱 顾国华
机构地区 National Defense Key Laboratory of Optoelectronic Engineering
出处 《Chinese Optics Letters》 SCIE EI CAS CSCD 2011年第5期74-77,共4页 中国光学快报（英文版）
基金 supported by the National Defense Pre-Research Fund of China (No. 40405050303) the NationalNatural Science Foundation of Jiangsu, China (No.BK2008049) the NUST Research Funding (No.2010ZDJH12)
关键词 GERMANIUM
分类号 TH744 [机械工程—光学工程]
  • 相关文献

参考文献9

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同被引文献13

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  • 8Miller J L, Wiltse J M. Benefits of microscan for staring infrared imagers[C]//SPIE, 2004, 5407: 127-138.
  • 9Wang Z, Glazowski C E, Zavislan J M. Modulation transfer function measurement of.scanning reflectance microscopes[J]. Journal of the Optical Society of America, 2007, 12 (5): O518O2.
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引证文献1

Chinese Optics Letters
2011年 第5期

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