摘要
嵌入式设备对测试数据的有效管理体现在记录的存储量和读取速度上。因存储记录的空间资源有限,嵌入式开发中对变长记录寻址的算法要在空间利用率和运行时间上寻求平衡。给出了嵌入式开发中变长记录寻址的3种算法,对它们的特点进行了比较,并通过实验讨论了各算法的适用范围。
It is reflected in the storage capacity and reading speed for records that the effectiveness of embedded device＇s management of test data.Because the space resource is limited to store records,we must balance the space utilization and running time of addressing algorithm for the variable-length records in embedded development.This paper proposes three addressing algorithms and compares their features.At last,it discusses the scope of algorithms＇ application by experiments.
出处
《电脑编程技巧与维护》
2011年第10期99-101,105,共4页
Computer Programming Skills & Maintenance
关键词
嵌入式开发
变长记录
寻址
空间利用率
运行时间
embedded development
variable-length record
addressing
space utilization
running time
