基于GEP的网格测试中关键组件选取的研究

Research on grid test optimization based on GEP

针对网格测试中测试难度大、复杂性强等特点,提出了"分级测试"[1]的模型.即将待测组件分为一级"关键组件集"[2-3]、二级"关键组件相关集"等待测组件集.而后再有针对性地进行测试.同时还提出,模型中可以通过基于基因表达式编程(GEP)的关键组件选取方法来进行一、二级组件集的构建.通过对组件的分级测试和选择,从而可大大减少网格测试中待测组件的总数量,从而大大减轻网格测试的时间开销,最终达到优化网格测试的目的.

In view of the deficiencies of Integration Testing to complex grid application software,a software component-grading test optimization model is proposed.Firstly,the all components are distinguished between a key component set,a key component related set,and so on.Then,a key component set selection method based on GEP is proposed to confirm the key component set and the key component related set.Experiments prove that the model can reduce the testing cost and time consumption,and it can attain the purpose of optimization software test by the component reduction.