基于机器视觉的IC快速定位检测

Rapid Positioning Detection of IC Based on Machine Vision

针对视觉检测中IC元件定位图像特征,提出了一种亚像素级圆形定位标志快速精确的检测方法,将点Hough变换的快速性和亚像素检测的精确性有机结合,提高了检测效率.实验结果表明,该方法具有效性和可靠性,为进一步检测芯片缺陷提供了保障.

For image features of IC element positioning in vision detection,and a quick and accurate detection method used a round positioning mark in sub-pixel level was put forward,which improved detection efficiency by combining the quickness of Hough transform of points with the accuracy of sub-pixel detection.Test results showed that the method was valid and reliable and provided an accuracy guarantee for further detecting chip defects.