摘要
本文研究了温度对 ZnS∶ErF_3薄膜 ACEL 特性的影响。通过测量不同温度下的 EL 光谱和 EL 衰减,讨论了 Er^(3+)离子间交叉弛豫过程对温度的依赖关系,初步探讨了~4S_(3/2)能级和~4F_(9/2)能级衰减时间随温度变化的原因。
The temperature effect on ACEL characteristics of ZnS∶ErF_3 thin films hasbeen studied.By measuring EL spectra and EL decay curves at different tempera-tures,the effect of temperature on the cross-relaxation processes occurred betweenEr ions has been discussed.In addition,the effect of temperature on decay time of^4S_(3/2) and ~4F_(9/2) energy levels has also been discussed.
出处
《无机材料学报》
SCIE
EI
CAS
CSCD
北大核心
1990年第4期330-334,共5页
Journal of Inorganic Materials