摘要
本文通过对自动测试设备/系统(ATE/ATS)现状的分析,指出了当前ATE/ATS存在的主要问题。找出了当前自动测试系统通用性差和可移植性差的原因。对IEEE1641(STD)提出的背景、层次结构和目的进行了简要的介绍。分析了STD在通用ATS中的应用范围,通过对被测单元(UUT)和测试程序(TP)的研究,提出了信号层的概念,隔离了TPS与硬件的关系,为实现面向信号编程提供了条件,为通用自动测试系统(GPATS)的开发与设计奠定了理论基础。最后通过ATML系列标准和STD结合实例说明了STD在测试程序中的应用范围,证明了STD对于提高测试程序的可移植性的能力,并为今后STD的发展指出了方向。
By the analysis of ATE/ATS,the current problem exists in ATE/ATS is pointed out and the cause of poor portability is sated out.A brief introduction to the background,the structure and the purpose is made.The application of general ATS is discussed.What’s more,the conception of signal layer is put forward which provides the condition for signal oriented programming and lay a solid foundation for the development of general ATE/ATS by the analysis of the characteristics of UUT and TP(Test Program).Finally,an example using ATML and STD is put forward to illustrate the portability of the TP and the application scope of the STD ,What’s more,the application direction is also pointed out.
出处
《电子测试》
2011年第5期100-103,共4页
Electronic Test