用FTIR的OMNI-采样技术快速、准确鉴定未知样品

The rapid and accurate identification of unknown sample using the OMNI-sampling technique of FTIR

欧米采样技术是新近发展的一种技术,适合于许多商品(样品)的快速分析鉴定,无需制样。本文介绍了欧米采样技术的原理,取样技术及方法的特点,并且例述了该法在日常商品检验中的快速、准确的鉴定未知样品的一些应用。

The OMNI-sampling technique is a unique single reflection HATR that utilize a spherical ATR crystal as the sampling surface. Since samples are normally analyzed by ATR with no sample preparation, it is a rapid technique for obtaining the infrared spectrum of a solid of liquid phase material. The principle of OMNI-sampler and characteristics of its sampling technique have been described in this paper. Some example applications have been introduced to identification of unknown materials. This method is rapid and accurate.