基于SRAM型FPGA测试技术的研究

Research on testing technology of SRAM FPGA

随着FPGA集成度和复杂性的增加,测试显得尤为重要。为了保证数字系统工作的稳定性,首先就要保证FPGA芯片的可靠性。从SRAM型FPGA的内部构造入手,对测试生成和测试故障模型关键技术进行了探讨和研究,解决了测试的故障覆盖率和测试速度之间的矛盾;并搭建了软硬件协同测试平台对测试理论进行了验证,该系统为FPGA芯片的稳定应用提供性能保障。

With the development of complexity and integration of FPGA,the test technology becomes more important.With the flexible programmable features,large digital system can be established based on FPGA.For the stability of digital system,FPGA should be reliable.Based on the study on internal structure of SRAM FPGA,key technologies of test models are discussed to solve the contradiction between the testing fault coverage and testing speed.Finally,a collaborative testing platform formed by software and hardware is build to verify the testing theory.