摘要
研究一次和二次烧成对CaO-B2O3-SiO2(CBS)微晶玻璃的烧结性能与介电性能的影响。用X线衍射(XRD)、扫描电镜(SEM)等分析探讨二次烧成对CBS微晶玻璃的微观结构与介电性能的关系。结果表明:与一次烧成相比,二次烧成能够促进玻璃体中的小晶粒生长,试样的收缩率和体积密度有所增加,有利于介电常数提高和介质损耗的降低,且体系中没有出现新的晶相;875℃烧结的试样,X/Y轴收缩率均为14.33%,体积密度达到2.46 g/cm3,10MHz介电常数和损耗相应为6.21和3.5×10-3,热膨胀系数为11.86×10-6/℃,抗折强度为157.36MPa。
CaO-B2O3-SiO2(CBS) glass ceramics was prepared by dry-process.The effects of first sintering and second sintering on sintering properties and dielectric properties at 10 MHz were investigated.The relationships among second sintering,micro-structures and dielectric properties of CBS glass ceramics were studied by X-ray diffraction(XRD) and scanning electron microscope(SEM).The results indicated that compared with the first sintering,the second sintering had some effects on obtaining small size grain,increasing shrinking the bulk density and optimizing microwave dielectric properties,No new crystalline phase was observed in the systems.The sample could be sintered at 875 ℃ with X/Y shrinking of 14.33% and the density of 2.46 g/cm3.It had a dielectric constant of 6.21,a dielectric loss of 3.5×10-3 at 10 MHz.And the CTE value of CBS glass ceramics measured at on temperature of 875 ℃ was 11.86×10-6/℃,the flexure strength was 157.36 MPa.
出处
《南京工业大学学报(自然科学版)》
CAS
北大核心
2011年第3期11-14,共4页
Journal of Nanjing Tech University(Natural Science Edition)
基金
国家高技术研究发展计划(863计划)资助项目(2007AA03Z0455)
江苏省产学研科技支撑资助项目(BE2009168)
关键词
二次烧成
钙硼硅玻璃
性能
second sintering
CaO-B2O3-SiO2 glass
properties