磁存储硬盘表面全氟聚醚衍生物润滑膜的X射线光电子能谱研究

XPS Study of Perfluoropolyether Derivative Lubricating Film on Hard Disk

利用 Ｘ Ｐ Ｓ分析了计算机硬盘表面全氟聚醚衍生物润滑膜的结构．结果表明，根据 Ｘ Ｐ Ｓ谱图中的 Ｃ１ｓ 峰位可以分辨润滑剂化学结构式中各官能团；根据硬盘衬底的 Ｃ— Ｏ 基团和 Ｐ Ｆ Ｐ Ｅ的 Ｆ— Ｏ 基团的 Ｏ１ｓ 峰强之比可以确定硬盘表面润滑膜的厚度；因工艺条件不同，膜厚处在１．５～６．０ ｎｍ

The structure of a perfluoropolyether derivative lubricating film (Commercial name: Z DOL) on hard disk was investigated by means of X ray photoelectron spectroscopy. As the results, the radicals in the lubricant molecules are found to be identifiable from the relevant XPS spectra of C1s. The thickness of the lubricating film can be determined from the peak intensity ratio of O1s(C—O) with respect to the protective layer CN x on the hard disk to that in perfluoropolyether (Radical F—O). The film thickness is variable within a range of 1.5～6.0 nm,depending on the process for preparation of the lubricating film on the hard disk.