摘要
介绍基于ＣＣＤ的临界角检测法以及精度分析。讨论了光强分布对精度的影响，提出了截断点选择要求。
A critical angle measurement method based on CCD and the accuracy analysis are introduced in the paper.The influence of light intensity distribution on the measuring accuracy is discussed and the demand on the selection of the cut off point is proposed.The related analysis can be applied to the research on liquid refractive index.
出处
《光电工程》
CAS
CSCD
1999年第4期69-72,共4页
Opto-Electronic Engineering
关键词
折射率测量
临界角
电荷耦合器件
精度分析
CCD
Refractivity measurement,Critical angle,Charge-Coupled Devices,Accuracy analysis.
