养分胁迫条件下石斛兰叶片表面结构的电镜观察

Scanning electron microscopic observation on leaves surface structure of Dendrobium under untrition stress

本文运用扫描电镜（ＳＥＭ）技术，对石斛兰在养分胁迫条件下叶片的表面结构作了扫描观察。发现当养分胁迫时，叶表面角质层花纹发生改变，叶片气孔形状，数量均受养分营养状况的制约。缺Ｓ时叶片角质层被剥蚀，缺Ｋ

The leaves surface structure of Dendrobium Panda No.1 under the nutrient stress had been observed by the scanning electron microscopic method. The result showed that the stripes of leaves surface cuticle, the shape and quantity of stomata were very different. The leaves cuticle was peeled off by S\|deficiency, the leaves surface had crystallizes due to K\|deficiency.