摘要
The influence that the holding time exerts on the microwave dielectric property of the glass-ceramic of SiO2-Al2O3-SrO-ZnO-La2O3under 750℃ is studied.The dielectric property is measured by perturbation method and the microcrystalline phase has been analyzed by XRD and SEM.The new glass phase La2ZrTiO7 produced by the reaction(Q=1800,τε=+500ppm/℃) is of great signality to the development of new microwave dielectric materials.The sample which was insulated at 750℃ for 35h with superior dielectric properties: εr=12.82,Q=1150,τε=-19.5ppm/℃.
The influence that the holding time exerts on the microwave dielectric property of the glass-ceramic of SiO2-Al2O3-SrO-ZnO-La2O3under 750℃ is studied.The dielectric property is measured by perturbation method and the microcrystalline phase has been analyzed by XRD and SEM.The new glass phase La2ZrTiO7 produced by the reaction（Q=1800,τε=＋500ppm/℃） is of great signality to the development of new microwave dielectric materials.The sample which was insulated at 750℃ for 35h with superior dielectric properties： εr=12.82,Q=1150,τε=-19.5ppm/℃.
出处
《科技信息》
2011年第16期I0162-I0163,共2页
Science & Technology Information
关键词
绝缘道具
微波
热疗
玻璃
陶器
Glass-ceramic
Microwave
Dielectric property
Heat-treatment
