1M. Abramovici, M. A. Breuer, A. D. Friedman. Digital systems testing and testable design [M].IEEE Press, New York, 1990.
2Sya] M, Arora R, Hsiao MS. Extended forward implications and dual recurrence relations to identify sequentially untestable faults[C].2005.
3Zhao JK, Rudnick EM, Patel JH. Static logic implication with application to redundancy identification[C].1997.
4Schulz MH, Trischler E, Sarfert TM. SOCRATES: a highly efficient automatic test pattern generation system [J]. Computer-Aided Design of Integrated Circuits and Systems, 1988,7(1):126-137.
