用微量-热分析(μTA)表征聚合物膜

Characterization of Thin Films and Multilayer Films Using Microthermal Analysis

微量－热分析是一种结合原子力显微镜显示能力和热分析表征能力的崭新技术。它以原子力显微镜显示材料的形貌、热传导和热扩散的区域分布。

Microthermal analysis (TA) is a new technique that combines the visualization power of atomic force microscopy (AFM) with the characterization capabilities of thermal analysis. First, the AFM is used to image topography, thermal conductivity, and thermal diffusivity of a sample. Secondly, localized thermal analysis experiments are performed on a small part of the imaged sample to characterize the sample's physical and chemical properties.