摘要
针对实现了边界扫描可测试性设计的微处理器的特点， 提出了一种改进的微处理器功能测试算法。应用该算法我们成功地完成了３２ 位 Ｒ Ｉ Ｓ Ｃ 芯片 Ｌ Ｓ８５３２ Ａ
In this paper, from the point of the microprocessor which is designed for testability, we present a refined functional test arithmetic for the microprocessor. Applying this test arithmetic, we successfully completed the test to the LS8532A which is a 32-bit RISC.
出处
《计算机自动测量与控制》
CSCD
1999年第3期35-39,共5页
Computer Automated Measurement & Control
基金
予研基金资助项目
关键词
微处理器
边界扫描
功能测试
算法
functional test
boundary scan
fault model
test arithmetic
