16位逐次逼近A/D转换器熔丝误差修调技术

Fuse-Error Correction for 16-Bit Successive Approximation Register A/D Converter

提出了一种提高16位逐次逼近(SAR)A/D转换器精度的熔丝误差修调技术。该技术用于提高A/D转换器内部核心模块—16位DAC的精度,从而达到提高整个A/D转换器精度的目的。电路采用标准CMOS工艺流片。测试结果显示,熔丝误差修调后,常温下,电路的INL为2.5 LSB,SNR为88.8 dB,零点误差EZ为1.1 LSB;修调后,A/D转换器有效位数ENOB从12.56位提高到14.46位。

A fuse-error correction technique was proposed to improve resolution of 16-bit successive approximation register（SAR） A/D converter.Using this technique,resolution of a 16-bit DAC,which is a core block in an A/D converter,was improved.The A/D converter was implemented in standard CMOS process.The circuit was tested at room temperature after fuse-error correction.Results showed that,after fuse-error correction,the converter had an INL of 2.5 LSB,an SNR of 88.8 dB,and a zero error（EZ） of 1.1 LSB,and its ENOB was improved from 12.56 bits to 14.46 bits.