摘要
ICP-AES中仍然存在比较复杂的基体效应及一定程度的化学干扰,许多元素的灵敏线还受到共存元素不同程度的光谱干扰,如背景漂移、谱线重叠及光散射等。在实际分析工作中,这些干扰必须予以校正。对于固定多通道光谱仪,干扰的校正尤为重要。文献上已报道了多种校正方法,但每种方法都存在着局限性。其中。
A 'minor factor overlapping design' method is proposed for the correction of interferences in ICP-AES. This msthod greatly simplifies the experimental points normally required for the general experimental design. Thus fewer standard solutions are needed for the calibration. Inteferences due to complex sample matrices as well as nonlinear interfereaces can be easily and accurately corrected.
出处
《光谱学与光谱分析》
SCIE
EI
CAS
CSCD
北大核心
1989年第4期55-61,共7页
Spectroscopy and Spectral Analysis
