自组装单分子膜表征技术的研究

Self-assembly monolayers and their characterization

对自组装单分子膜技术的研究是具有广泛的实用价值与应用价值的,随着自组装技术的深入发展其应用领域也更加广泛,同时其大量的表征方法也日益更新。本文主要从以下几方面对自组装膜的表征手段作出了对比分析,例如:光、电化学分析方法、光谱学测试方法、微观显微学测试法等及自组装分子膜的相关辅助手段,例如:粗糙度检测法、金像显微观测法、椭圆光度法等,并对其发展前景作了展望。

The study of self - assembled monolayer is of wide range of value. With the development of self - assembly monolayers （SAMs） in a wide variety of fields, new methods for characterization of SAMs are urgent to come out. In this paper, the characterization methods on SAMs in recent years by the means of electrochemistry, spectroscopy, micrology and the roughness measuring instrument of stylus, jin xiang microscope, ellipsometry are reviewed. The potential development of the SAMs is also proposed.