点阵常数测定中的折射修正

Refraction Correction on Determining the Lattice Constant

根据晶体的折射原理提出了在测定点阵常数时进行折射修正的一种简易方法：基于点阵常数与衍射角之间的简单关系，通过对实测数据作最佳线性拟合，利用外推法求得“精确的”点阵常数。利用这一方法测定了几种不同粉末样本的点阵常数，线性外推的结果表明，尽管精度还受到其它因素的影响，但是比数值平均法的精度提高了若干倍。此外，这一方法不需要作复杂的修正计算，原理简单，容易实行。

A simple method of refraction correction to determine the lattice constant is proposed in thelight of crystal refraction. Precise lattice constant is obtained by an extrapolated approach with best linear fit to the measured value based on the simple relation between the lattice constant and the diffracted angle.The lattice constant of several powder samples are measured with this method and the results show thatthe precision, though affected by other factors, is several times higher than that of arithmetical mean value. In addition, this method avoids the difficult correction calculation and is simple and easy to apply.